How to test efficiently with advanced forcing features in TEMS Pocket


A world-first from TEMS Pocket with the introduction of a wide array of advanced control functions on Samsung’s proprietary baseband chipset, usually referred to as the Shannon chipset: RAT lock, Band lock, EARFCN/PCI lock, UARFCN/SC lock and ARFCN lock. Many of the new devices supporting these features are also LTE Category 20, which allows testing of 7 Carrier Aggregation. Forcing features enable engineers to test networks in a non-intrusive fashion, for which the alternative would be to change networks settings, test during odd hours or even de-commission sites temporarily. All of the alternatives are costly and error prone in comparison.

View More
View Less

Share this video